The single beam Z-Scan technique, a two beam Pulse-Delay Modulation Technique (PDMT), and a combination of these methods are implemented to measure both nonlinear absorption and nonlinear refraction in semiconductors. The laser source used is a Kerr Lens Modelocked (KLM) Ti:sapphire laser producing tunable near IR 100 femtosecond pulses of ~5 nJ of energy per pulse at a 90 MHz repetition rate. Specifically we monitor two photon absorption and the bound electronic nonlinear refraction in ZnSe and this nonlinear refraction in ZnS. These techniques open the spectral range where these nonlinear optical parameters can be measured by allowing tunable high repetition rate low pulse energy lasers to be used. In the past such measurements have been made primarily with high energy low repetition rate lasers such as Q-switched or modelocked and Q-switched Nd3+:YAG lasers and its harmonics or Nd3+:YAG pumped dye lasers. Such dye lasers while tunable are difficult to use and require organic dyes and solvents which may be flammable and/or carcinogenic. Recently, the solid state KLM Ti:sapphire laser has also been used to pump broadly tunable Optical Parametric Oscillators. The techniques discussed in this thesis will also allow such sources to be used for nonlinear optical measurements. Additionally, these material measurement techniques have a great deal in common with autocorrelation pulse width measurement techniques. Therefore, this thesis also discusses the pulse width measurement techniques that we used to characterize our laser system.
Master of Science (M.S.)
College of Engineering
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Masters Thesis (Open Access)
Dissertations, Academic -- Engineering; Engineering -- Dissertations, Academic
Croglio, Nicholas J., "Implementation of Ultrafast Optical Characterization Techniques" (1994). Retrospective Theses and Dissertations. 3409.