This paper provides a brief historical discussion of the development of time division low level multiplexing techniques and especially emphasizes MOS-FET multiplexers currently being implemented. Error sources which may affect system accuracy and therefore must be considered in the design of the multiplexer are described. Some of the more significant of these errors: aliasing, interchannel crosstalk, static offset, transient coupled errors, and common-mode injected errors are analyzed and covered in detail. Equations expressing the overall interchannel DC crosstalk and static offset for a generalized multiplexer are derived and presented. Settling errors arising from transient events in time division multiplexers are derived for a two channel multiplexer and plotted to illustrate their dependency on the multiplexer input and output capacitances. A multi-tier channel path is also examined for common-mode to differential-mode signal conversion. As a conclusion, the author discusses how these error sources accumulate and gives a means for predicting the overall cumulative average error to be expected from the time division multiplexing equipment.
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Harden, Richard C.
Master of Science (M.S.)
College of Engineering
Length of Campus-only Access
Masters Thesis (Open Access)
Griffin, Lloyd Daniel, "Accumulative Errors in Low-Level MOS-FET Multiplexers" (1973). Retrospective Theses and Dissertations. 53.