Title

Statistical Sensitivity Analysis Of Mosfet Integrated Circuits Using Process Database

Abstract

This paper presents a systematic approach for analyzing MOSFET integrated circuit performance as functions of MOSFET channel length and channel width variations. The methodology, which involves an algorithm based on the Tellegen's theorem and a database that contains the statistical information of MOSFET process parameters, is implemented in SPICE2 circuit simulator. Sensitivity simulation of a MOSFET operational amplifier Is included to illustrate the usefulness of the method. © 1989 IEEE.

Publication Date

12-1-1989

Publication Title

Proceedings of the Custom Integrated Circuits Conference

Document Type

Article; Proceedings Paper

Personal Identifier

scopus

DOI Link

https://doi.org/10.1109/CICC.1989.56805

Socpus ID

84869396430 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/84869396430

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