Title

Statistical And Numerical Method For Mosfet Integrated-Circuit Sensitivity Simulation Using Spice

Abstract

Circuit sensitivity analysis helps a circuit designer to determine which transistors in a circuit are most influential on its performance and how variations of the device and process parameters affect the circuit output responses. The paper presents a systematic approach for analysis of metal-oxide-semiconductor field effect transistor (MOSFET) integrated circuit DC performance as a function of channel length and width variations. The method, which involves an algorithm based on the Tellegen theorem and a database that contains statistical information on MOSFET process parameters, is implemented in the widely used SPICE2 circuit simulator. Sensitivity simulation of a MOSFET operational amplifier is included to illustrate the usefulness of the method.

Publication Date

1-1-1991

Publication Title

IEE proceedings. Part G. Electronic circuits and systems

Volume

138

Issue

1

Number of Pages

77-82

Document Type

Article

Personal Identifier

scopus

DOI Link

https://doi.org/10.1049/ip-g-2.1991.0015

Socpus ID

0026103027 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/0026103027

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