Title

First-Order Sensitivity Analysis Of Quartz Crystal Resonator Model Parameters

Abstract

Often quartz crystal resonator equivalent electrical model parameters are extracted from measured scattering (S-) parameters. Because all measurement systems have random measurement errors, a first-order measurement sensitivity analysis of a single mode, quartz resonator device model was conducted. The analysis predicts the variations in the motional arm resistance versus the resonance S-parameter as a function of measurement errors. The accuracy of this first-order sensitivity analysis is verified by computer simulation and experimentally. The model parameters were extracted following the recommended EIA-512 standard. The theoretical first-order sensitivity analysis, the computer simulation results, and the experimental measurements are found to be in good agreement. © 1990, IEEE

Publication Date

1-1-1990

Publication Title

IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control

Volume

37

Issue

6

Number of Pages

602-603

Document Type

Article

Personal Identifier

scopus

DOI Link

https://doi.org/10.1109/58.63119

Socpus ID

0025516716 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/0025516716

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