Title
Transient Analysis Of Minority Carrier Diffusion In The Base Of P/N Junction Diodes And Bipolar Transistors
Keywords
Semiconductor device modeling; Transient analysis
Abstract
The time-dependent minority carrier distribution in the base of a bipolar p/n junction subjected to a step-up or step-down (switch-on or switch-off) applied voltage has been obtained. Analytical expressions are found by solving the time-dependent minority-carrier diffusion equation with appropriate boundary conditions. A general case with arbitrary base width under both switch-on and switch-off transients is considered. In addition, the validity of the constant-voltage and constant-current approaches under different base widths and different bias conditions are also discussed. This analytical approach is also applied to obtain the turn-on current transients of a forward-active bipolar transistor. The results are compared with those simulated from the conventional Gummel-Poon model and obtained from measurement. © 1995 The Japan Society of Applied Physics.
Publication Date
1-1-1995
Publication Title
Japanese Journal of Applied Physics
Volume
34
Issue
10
Number of Pages
5562-5566
Document Type
Article
Personal Identifier
scopus
DOI Link
https://doi.org/10.1143/JJAP.34.5562
Copyright Status
Unknown
Socpus ID
0029390576 (Scopus)
Source API URL
https://api.elsevier.com/content/abstract/scopus_id/0029390576
STARS Citation
Hasselbeck, M. P. and Liou, J. J., "Transient Analysis Of Minority Carrier Diffusion In The Base Of P/N Junction Diodes And Bipolar Transistors" (1995). Scopus Export 1990s. 1810.
https://stars.library.ucf.edu/scopus1990/1810