Title
Z-Scan Measurement Of Third And Fifth Order Nonlinearities In Single Crystal Pts At 1064 Nm
Abstract
Z-scan at 1064 nm was used with single, 35 psec pulses to measure the third and fifth order nonlinear refraction and absorption in single crystal PTS (p-toluene sulfonate). Nonlinear effects higher than third order were found at intensities greater than 0.5 GW/cm2. As a result detailed analysis of the Z-scan data was necessary to deduce n2 and n3 where Δn = n2I + n3I2, and α2 and α3 defined by Δα = α2I + α3I2. At this wavelength both n2 and α2 were positive and n3 and α3 were found to be negative.
Publication Date
1-1-1995
Publication Title
Molecular Crystals and Liquid Crystals Science and Technology Section B: Nonlinear Optics
Volume
10
Issue
1-4
Number of Pages
193-205
Document Type
Article
Personal Identifier
scopus
Copyright Status
Unknown
Socpus ID
0029227368 (Scopus)
Source API URL
https://api.elsevier.com/content/abstract/scopus_id/0029227368
STARS Citation
Lawrence, Brian L.; Cha, Myoungsik; and Torruellas, William E., "Z-Scan Measurement Of Third And Fifth Order Nonlinearities In Single Crystal Pts At 1064 Nm" (1995). Scopus Export 1990s. 1900.
https://stars.library.ucf.edu/scopus1990/1900