Title

Z Scan Using Circularly Symmetric Beams

Abstract

We report general characteristics of on-axis Z-scan transmittance for arbitrary circularly symmetric beams. Some experimental results are presented for a nearly top-hat-shaped beam and for a trimmed Airy beam whose electric field profile is the central portion of an Airy function inside its first zero. The sensitivity of Z-scan method with a trimmed Airy beam for measuring an induced index-of-refraction change is a factor of 1.5 greater than that of a Gaussian beam. Also, it is found that there are some advantages of experimental alignment and numerical convergence for a Z-scan measurement that uses a trimmed Airy beam over one that uses a top-hat beam. © 1996 Optical Society of America.

Publication Date

1-1-1996

Publication Title

Journal of the Optical Society of America B: Optical Physics

Volume

13

Issue

12

Number of Pages

2720-2723

Document Type

Article

Personal Identifier

scopus

DOI Link

https://doi.org/10.1364/JOSAB.13.002720

Socpus ID

0030417810 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/0030417810

This document is currently not available here.

Share

COinS