Title
Gate-oxide thickness dependence of LDD MOSFET parameters
Publication Date
1-1-1997
Publication Title
Solid-State Electronics
Volume
41
Issue
8
Number of Pages
1199-1201
Document Type
Article
Personal Identifier
scopus
DOI Link
https://doi.org/10.1016/S0038-1101(97)00046-4
Copyright Status
Unknown
Socpus ID
0031213098 (Scopus)
Source API URL
https://api.elsevier.com/content/abstract/scopus_id/0031213098
STARS Citation
Hassan, Md R.; Liou, J. J.; and Ortiz-Conde, A., "Gate-oxide thickness dependence of LDD MOSFET parameters" (1997). Scopus Export 1990s. 2793.
https://stars.library.ucf.edu/scopus1990/2793
COinS