Title
Theoretical investigation of the electrical behavior of SiC MESFETs for microwave power amplification
Keywords
Cut-Off Frequency; Device Simulation; Microwave Devices; Output Power; SiC MESFET
Abstract
The electrical behavior of 3C, 4H, and 6H SiC MESFETs has been simulated using an analytical two region transistor model which takes into account the nonlinear v-E characteristics, incomplete ionization, and self heating. The results show that the 4H SiC polytype is best suited for microwave power MESFETs, but 3C and 6H SiC also seem to be useful materials for this purpose. Using Si instead of SiC as the subtrate material causes increased channel temperatures and a deterioration of the transistor performance at high gate-source voltages.
Publication Date
1-1-1998
Publication Title
Materials Science Forum
Volume
264-268
Issue
PART 2
Number of Pages
973-976
Document Type
Article
Personal Identifier
scopus
DOI Link
https://doi.org/10.4028/www.scientific.net/msf.264-268.973
Copyright Status
Unknown
Socpus ID
0031699019 (Scopus)
Source API URL
https://api.elsevier.com/content/abstract/scopus_id/0031699019
STARS Citation
Schwierz, F.; Roschke, M.; and Liou, J. J., "Theoretical investigation of the electrical behavior of SiC MESFETs for microwave power amplification" (1998). Scopus Export 1990s. 3400.
https://stars.library.ucf.edu/scopus1990/3400