Title
Time-Resolved Z-Scan Measurements Of Optical Nonlinearities
Abstract
We introduce a temporal delay in one beam of the two-color Z-scan apparatus, which measures nondegenerate nonlinear absorption and nondegenerate nonlinear refraction. This technique allows us to time resolve separately the sign and the magnitude of the nonlinear absorption and refraction at frequency p that are due to the presence of a strong excitation at frequency oe. For example, in semiconductors we specifically measure the bound electronic, nondegenerate nonlinear refraction and nondegenerate two-photon absorption, as well as the two-photon-generated free-carrier refraction and absorption as functions of time. We demonstrate this technique on ZnSe, ZnS, and CS2, using picosecond pulses at 1.06 and 0.532μm. © 1994 Optical Society of America.
Publication Date
1-1-1994
Publication Title
Journal of the Optical Society of America B: Optical Physics
Volume
11
Issue
6
Number of Pages
1009-1017
Document Type
Article
Identifier
scopus
Personal Identifier
scopus
DOI Link
https://doi.org/10.1364/JOSAB.11.001009
Copyright Status
Unknown
Socpus ID
0028460078 (Scopus)
Source API URL
https://api.elsevier.com/content/abstract/scopus_id/0028460078
STARS Citation
Wang, J.; Sheik-Bahae, M.; and Said, A. A., "Time-Resolved Z-Scan Measurements Of Optical Nonlinearities" (1994). Scopus Export 1990s. 342.
https://stars.library.ucf.edu/scopus1990/342