Title
Staring imager minimum resolvable temperature measurements beyond the sensor half sample rate
Keywords
Minimum resolvable temperature difference; Sampled imaging system
Abstract
It is a well-known phenomenon that three- and four-bar patterns can sometimes be resolved with staring sensors even when the bar pattern frequency is beyond the half sample rate of the sensor. When performing a minimum resolvable temperature (MRT) test, for example, the modulation of the target bars can be significant even when the fundamental frequency of the four-bar target is higher than the half sample rate of the sensor. We show that the modulation of a four-bar target goes to zero at 0.6 times the sample rate of the sensor (1.2 times the half sample rate) if the sample phasing is optimized. If the bar pattern contains a larger number of bars, the modulation cutoff approaches the half sample rate of the sensor. Further, we illustrate that, when the sample phase is optimized during the MRT measurement, the MRT performance of a sampled imager can exceed the measured MRT performance of an analog sensor with the same system and component modulation transfer functions. © 1998 Society of Photo-Optical Instrumentation Engineers.
Publication Date
1-1-1998
Publication Title
Optical Engineering
Volume
37
Issue
6
Number of Pages
1763-1769
Document Type
Article
Personal Identifier
scopus
DOI Link
https://doi.org/10.1117/1.601829
Copyright Status
Unknown
Socpus ID
0010481229 (Scopus)
Source API URL
https://api.elsevier.com/content/abstract/scopus_id/0010481229
STARS Citation
Vollmerhausen, Richard; Driggers, Ronald G.; and Webb, Curtis, "Staring imager minimum resolvable temperature measurements beyond the sensor half sample rate" (1998). Scopus Export 1990s. 3489.
https://stars.library.ucf.edu/scopus1990/3489