Title

Carrier Escape Dynamics In A Single Quantum Well Waveguide Modulator

Abstract

Picosecond excite-probe studies are performed on a single quantum well waveguide modulator giving a direct measure of the escape of photogenerated carriers from a quantum well. Both the effects of exciton saturation and external field screening are observed in the transient transmission change. The results are consistent with the escape of carriers by thermionic emission. © 1993 Chapman & Hall.

Publication Date

12-1-1993

Publication Title

Optical and Quantum Electronics

Volume

25

Issue

12

Document Type

Article

Identifier

scopus

Personal Identifier

scopus

DOI Link

https://doi.org/10.1007/BF00430338

Socpus ID

0027841450 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/0027841450

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