Title
Determination Of The Orientational Order Parameters In Polysilane Lb-Films By Measuring Third-Order-Susceptibility Tensor Components
Abstract
We demonstrate a new method for investigating the orientational distribution of the rod-like poly[bis(m-butoxyphenyl) silane] molecules in Langmuir-Blodgett (LB) films. The first two non-trivial in-plane orientational order parameters C2 and C4 could be easily deduced by measuring the independent tensor components of χ(3)(- approximately ega 3; approximately ega1, approximately ega1, approximately ega2). Using this method, we show that the annealing process improves the molecular alignment along the dipping direction. We were also able to get information about the domain morphology of the film from the off-diagonal components of χ(3).
Publication Date
1-1-1993
Publication Title
Proceedings of SPIE - The International Society for Optical Engineering
Volume
1852
Number of Pages
151-161
Document Type
Article; Proceedings Paper
Identifier
scopus
Personal Identifier
scopus
Copyright Status
Unknown
Socpus ID
0027290133 (Scopus)
Source API URL
https://api.elsevier.com/content/abstract/scopus_id/0027290133
STARS Citation
Cha, Myoungsik; Neher, Dieter; and Embs, F. W., "Determination Of The Orientational Order Parameters In Polysilane Lb-Films By Measuring Third-Order-Susceptibility Tensor Components" (1993). Scopus Export 1990s. 790.
https://stars.library.ucf.edu/scopus1990/790