Title

Determination Of The Orientational Order Parameters In Polysilane Lb-Films By Measuring Third-Order-Susceptibility Tensor Components

Abstract

We demonstrate a new method for investigating the orientational distribution of the rod-like poly[bis(m-butoxyphenyl) silane] molecules in Langmuir-Blodgett (LB) films. The first two non-trivial in-plane orientational order parameters C2 and C4 could be easily deduced by measuring the independent tensor components of χ(3)(- approximately ega 3; approximately ega1, approximately ega1, approximately ega2). Using this method, we show that the annealing process improves the molecular alignment along the dipping direction. We were also able to get information about the domain morphology of the film from the off-diagonal components of χ(3).

Publication Date

1-1-1993

Publication Title

Proceedings of SPIE - The International Society for Optical Engineering

Volume

1852

Number of Pages

151-161

Document Type

Article; Proceedings Paper

Identifier

scopus

Personal Identifier

scopus

Socpus ID

0027290133 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/0027290133

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