Title

Characterization Of A Flat-Field Grazing-Incidence Xuv Spectrometer

Abstract

We describe a XUV spectrometer for the study of dense hot microplasmas at wavelengths between ≈50 and ≈300 Å. It uses a commercially fabricated grazing incidence flat-field reflection grating with 1200 grooves per millimeter. The spectral resolution was optimized by imaging the source on a narrow slit with the help of a curved grazing incidence mirror. The instrument was tested with a laser-produced plasma as a source. The limit of the resolving power due to imaging aberrations of the flat-field grating ranges from 1500 at 50 Å to 3600 at 200 Å and has been achieved with a 5-μm slit. We also measured and calculated the grating efficiencies for the first to fifth diffraction order as a function of wavelength. © 1993 IOS Press. All rights reserved.

Publication Date

1-1-1993

Publication Title

Journal of X-Ray Science and Technology

Volume

4

Issue

1

Number of Pages

8-17

Document Type

Article

Identifier

scopus

Personal Identifier

scopus

DOI Link

https://doi.org/10.3233/XST-1993-4102

Socpus ID

0003375848 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/0003375848

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