Title

Near Threshold 4D Photoexcitation And Photoionization Of Xe

Abstract

The angular distribution parameter β of the N5−O2, 3O2, 3 Auger lines has been measured between the 4d5/2 and the 4d3/2 thresholds of Xe using the cis technique. The radiationless decay parameter α2 for each of the Ns-O^Ojí Auger lines and the alignment parameter A20 for the intermediate ion were also determined. Comparisons with previous values of β and α2 for the N5−O2, 3O2, 3 Auger tines have been made. In addition, shakeoff to the various states of the Xe2+ 5p4 ion has been measured following 4d photoexcitation and found to be small. These results support the contention that near-zero kinetic energy electrons observed following similar photoexcitation in the rare gases result primarily from a two-step process rather than the direct process of shakeoff. © 1992 IOP Publishing Ltd.

Publication Date

11-28-1992

Publication Title

Journal of Physics B: Atomic, Molecular and Optical Physics

Volume

25

Issue

22

Number of Pages

4755-4771

Document Type

Article

Identifier

scopus

Personal Identifier

scopus

DOI Link

https://doi.org/10.1088/0953-4075/25/22/012

Socpus ID

0000456321 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/0000456321

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