Title
Excite-Probe Two-Color Z-Scan
Abstract
Using an excite-probe two-color Z-scan technique, we investigate the dynamics of optical nonlinearites in semiconductors with picosecond pulses at 1.06 and 0.532 μm. We use the technique to obtain a direct timeresolved measurement of the nondegenerate nonlinear refraction in polycrystalline ZnSe and show how it can resolve the bound electronic and free carrier components.
Publication Date
8-18-1992
Publication Title
Proceedings of SPIE - The International Society for Optical Engineering
Volume
1692
Number of Pages
63-66
Document Type
Article; Proceedings Paper
Identifier
scopus
Personal Identifier
scopus
DOI Link
https://doi.org/10.1117/12.138069
Copyright Status
Unknown
Socpus ID
85075931694 (Scopus)
Source API URL
https://api.elsevier.com/content/abstract/scopus_id/85075931694
STARS Citation
Wang, J.; Sheik-Bahae, M.; and Said, A. A., "Excite-Probe Two-Color Z-Scan" (1992). Scopus Export 1990s. 909.
https://stars.library.ucf.edu/scopus1990/909