Title
Use Of Narrowband Laser Speckle For Mtf Characterization Of Ccds
Abstract
This paper presents a method for measuring the modulation transfer function (MTF) of a detector array from zero frequency to twice the Nyquist frequency. The equipment is simple and requires no complex optical components. Also, the use of laser speckle circumvents the problems inherent with traditional methods of MTF testing where the phase of the test target with respect to the sampling grid affects the observed contrast. The MTF measured with this method is compared to the MTF measured using sine targets. The results of the two methods agree to within 2%.
Publication Date
8-12-1992
Publication Title
Proceedings of SPIE - The International Society for Optical Engineering
Volume
1683
Number of Pages
144-151
Document Type
Article; Proceedings Paper
Identifier
scopus
Personal Identifier
scopus
DOI Link
https://doi.org/10.1117/12.137767
Copyright Status
Unknown
Socpus ID
84864348662 (Scopus)
Source API URL
https://api.elsevier.com/content/abstract/scopus_id/84864348662
STARS Citation
Sensiper, Martin; Boreman, Glenn D.; and Ducharme, Alfred D., "Use Of Narrowband Laser Speckle For Mtf Characterization Of Ccds" (1992). Scopus Export 1990s. 911.
https://stars.library.ucf.edu/scopus1990/911