Title
Modulation-Transfer Function Measurement Of Sprite Detectors: Sine-Wave Response
Abstract
A method is presented for measuring the modulation transfer function of signal processing in the element (SPRITE) detectors with a HgCdTe composition optimized for the 3-5-nm band. This method incorporates a 3.39-Mm He-Ne laser to generate Young’s fringes of varying spatial frequency, which are scanned across the detector elements. The results are consistent with theoretical models for these devices and indicate a limited resolution capability for SPRITE detectors used for the 3-5-nm band. © 1992 Optical Society of America.
Publication Date
1-1-1992
Publication Title
Applied Optics
Volume
31
Issue
1
Number of Pages
144-147
Document Type
Article
Identifier
scopus
Personal Identifier
scopus
DOI Link
https://doi.org/10.1364/AO.31.000144
Copyright Status
Unknown
Socpus ID
84975662180 (Scopus)
Source API URL
https://api.elsevier.com/content/abstract/scopus_id/84975662180
STARS Citation
Barnard, Kenneth J.; Boreman, Glenn D.; and Plogstedt, Allen E., "Modulation-Transfer Function Measurement Of Sprite Detectors: Sine-Wave Response" (1992). Scopus Export 1990s. 983.
https://stars.library.ucf.edu/scopus1990/983