Title
A Model Of Mosfet'S Second Breakdown Action In Circuit-Level
Keywords
Circuit-level; Macro block; Modeling; MOS; Second breakdown
Abstract
A method to exact the electrical parameters and model the second breakdown action of MOSFET's under ESD (Electro-Static Discharge) on circuit-level, using TCAD simulation, is presented MOSFET is one of the most important ESD protection devices, and is widely used as I/O protection device in integrated circuits. We present an accurate macro model of the MOSFET based on deep analyzing of the physical mechanism of the second breakdown, using TCAD simulation. This macro model owns fine convergency and accuracy which are of importance to the simulation of the ESD protection ability of the ESD protection network on circuit and system level.
Publication Date
2-1-2008
Publication Title
Chinese Journal of Sensors and Actuators
Volume
21
Issue
2
Number of Pages
361-364
Document Type
Article
Personal Identifier
scopus
Copyright Status
Unknown
Socpus ID
43049108107 (Scopus)
Source API URL
https://api.elsevier.com/content/abstract/scopus_id/43049108107
STARS Citation
Cui, Qiang; Han, Yan; Dong, Shu Rong; Liu, Jun Jie; and Si, Rui Jun, "A Model Of Mosfet'S Second Breakdown Action In Circuit-Level" (2008). Scopus Export 2000s. 10716.
https://stars.library.ucf.edu/scopus2000/10716