Title
Electrophoretically Deposited Alumina As Protective Overlay For Thermal Barrier Coatings Against Cmas Degradation
Keywords
CMAS degradation; Electrophoretic deposition; Environmental degradation; Overlay barrier coating; Thermal barrier coating
Abstract
TBCs are increasingly susceptible to degradation by airborne CMAS deposits. In order to mitigate the CMAS attack, we fabricated a dense, crack-free alumina overlay for TBCs by electrophoretic deposition (EPD) technique. Overlay coatings of controlled thickness were successfully fabricated for YSZ TBCs, by EPD followed by controlled sintering at 1200 °C. YSZ with alumina overlay coatings were tested for CMAS attack at 1300 °C. Detailed examination of microstructural changes and phase evolution in CMAS tested specimens was performed by X-ray diffraction and electron microscopy. Dense alumina overlay produced by EPD was found to physically suppress the infiltration of CMAS. Furthermore, CMAS was found to crystallize into anorthite (CaAl2Si2O8) and MgAl2O4 spinel by chemically interacting with EPD α-Al2O3. A shift in CMAS glass composition to a crystallizable Al-rich glass composition promoted the formation of anorthite platelets (CaAl2Si2O8) and localized enrichment of Mg promoted the formation of MgAl2O4 spinel. EPD alumina overlay on commercial-production TBCs retained its adhesion and structural integrity after 20 cycles of 1-hour furnace thermal cycle test at 1100 °C. © 2009 Elsevier B.V. All rights reserved.
Publication Date
12-25-2009
Publication Title
Surface and Coatings Technology
Volume
204
Issue
6-7
Number of Pages
797-801
Document Type
Article
Personal Identifier
scopus
DOI Link
https://doi.org/10.1016/j.surfcoat.2009.09.055
Copyright Status
Unknown
Socpus ID
71849101610 (Scopus)
Source API URL
https://api.elsevier.com/content/abstract/scopus_id/71849101610
STARS Citation
Mohan, P.; Yao, B.; Patterson, T.; and Sohn, Y. H., "Electrophoretically Deposited Alumina As Protective Overlay For Thermal Barrier Coatings Against Cmas Degradation" (2009). Scopus Export 2000s. 11017.
https://stars.library.ucf.edu/scopus2000/11017