Title
Nanocrystalline Pbte Films
Keywords
Grain boundaries; Nanocrystalline films; Pbte semiconductor; Photoconductivity
Abstract
This work deals with the impact of nano-scale morphology on the photoelectric properties of n-type PbTe thin films. Nano-structured thin films were prepared by varying the rate of nucleation as a function of the nature and the temperature of the substrates. The broken bonds at the grain boundaries generate acceptor states in n-type films, capture electrons from the interior of the grains and give rise to p-type inversion layers between adjacent grains. A model based on the assumption that the current is exclusively due to the motion of holes in the inversion channels along the grain boundaries, is proposed to explain the temperature dependence of photoelectric properties. This approach allows designing infra-red detectors based on nano-crystalline lead chalcogenide films at the wavelength up to 4-5 μm that don't require cryogenic cooling. Copyright © 2009 American Scientific Publishers All rights reserved.
Publication Date
12-1-2009
Publication Title
Journal of Nanoelectronics and Optoelectronics
Volume
4
Issue
3
Number of Pages
296-301
Document Type
Article
Personal Identifier
scopus
DOI Link
https://doi.org/10.1166/jno.2009.1042
Copyright Status
Unknown
Socpus ID
77952713387 (Scopus)
Source API URL
https://api.elsevier.com/content/abstract/scopus_id/77952713387
STARS Citation
Dashevsky, Z.; Kreizman, R.; Shufer, E.; Kasiyan, V.; and Flitsiyan, E., "Nanocrystalline Pbte Films" (2009). Scopus Export 2000s. 11062.
https://stars.library.ucf.edu/scopus2000/11062