Title

Sub-Surface Interferometric Near-Field Tomography

Abstract

We describe a straightforward method to recover the sub-surface topography of coated samples with sub-diffraction limited resolution. Experimental verification is accomplished using a near-field scanning optical microscope (NSOM) operated in dual mode. © 2009 Optical Society of America.

Publication Date

12-1-2009

Publication Title

Optics InfoBase Conference Papers

Number of Pages

-

Document Type

Article; Proceedings Paper

Personal Identifier

scopus

Socpus ID

84898072876 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/84898072876

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