Title
Demonstration Of Pinhole Laser Beam Profiling Using A Digital Micromirror Device
Keywords
Digital micromirror device (DMD); Laser beam profiler; Laser measurement; Pinhole profiler
Abstract
Demonstrated for the first time, to the best of the authors' knowledge, is two-dimensional (2-D) pinhole laser beam profiling using a Texas Instruments visible band digital micromirror device (DMD). Software controlled micromirror digital tilt positions across the DMD plane create a moving pinhole for sampling an arbitrary distribution laser beam power profile. A 532-nm 0.5-W laser coupled to an optically addressed nematic liquid crystal spatial light modulator is used to generate a laser beam black-and-white high-resolution test line pattern having a 62.5-μm linewidth. The test pattern is successfully profiled using a DMD formed 27.36 μm × 27.36 μm pinhole. Demonstrated for the first time is 2-D knife-edge DMD-based profiling of an ultraviolet 337-nm 4-ns pulsewidth 10-Hz pulsed laser beam. © 2009 IEEE.
Publication Date
5-15-2009
Publication Title
IEEE Photonics Technology Letters
Volume
21
Issue
10
Number of Pages
666-668
Document Type
Article
Personal Identifier
scopus
DOI Link
https://doi.org/10.1109/LPT.2009.2016113
Copyright Status
Unknown
Socpus ID
67049086623 (Scopus)
Source API URL
https://api.elsevier.com/content/abstract/scopus_id/67049086623
STARS Citation
Sheikh, Mumtaz and Riza, Nabeel A., "Demonstration Of Pinhole Laser Beam Profiling Using A Digital Micromirror Device" (2009). Scopus Export 2000s. 11872.
https://stars.library.ucf.edu/scopus2000/11872