Title

Demonstration Of Pinhole Laser Beam Profiling Using A Digital Micromirror Device

Keywords

Digital micromirror device (DMD); Laser beam profiler; Laser measurement; Pinhole profiler

Abstract

Demonstrated for the first time, to the best of the authors' knowledge, is two-dimensional (2-D) pinhole laser beam profiling using a Texas Instruments visible band digital micromirror device (DMD). Software controlled micromirror digital tilt positions across the DMD plane create a moving pinhole for sampling an arbitrary distribution laser beam power profile. A 532-nm 0.5-W laser coupled to an optically addressed nematic liquid crystal spatial light modulator is used to generate a laser beam black-and-white high-resolution test line pattern having a 62.5-μm linewidth. The test pattern is successfully profiled using a DMD formed 27.36 μm × 27.36 μm pinhole. Demonstrated for the first time is 2-D knife-edge DMD-based profiling of an ultraviolet 337-nm 4-ns pulsewidth 10-Hz pulsed laser beam. © 2009 IEEE.

Publication Date

5-15-2009

Publication Title

IEEE Photonics Technology Letters

Volume

21

Issue

10

Number of Pages

666-668

Document Type

Article

Personal Identifier

scopus

DOI Link

https://doi.org/10.1109/LPT.2009.2016113

Socpus ID

67049086623 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/67049086623

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