Title
Resonant Terahertz Absorption By Plasmons In Grating-Gate Gan Hemt Structures
Keywords
Grating-gate devices; Plasma wave electronics; Plasmonic crystals; Plasmons; Terahertz detectors
Abstract
Pronounced resonant absorption and frequency dispersion associated with an excitation of collective 2D plasmons have been observed in terahertz (0.5-4THz) transmission spectra of grating-gate 2D electron gas AlGaN/GaN HEMT (high electron mobility transistor) structures at cryogenic temperatures. The resonance frequencies correspond to plasmons with wavevectors equal to the reciprocal-lattice vectors of the metal grating, which serves both as a gate electrode for the HEMT and a coupler between plasmons and incident terahertz radiation. The resonances are tunable by changing the applied gate voltage, which controls 2D electron gas concentration in the channel. The effect can be used for resonant detection of terahertz radiation and for "on-chip" terahertz spectroscopy. © 2009 SPIE.
Publication Date
9-8-2009
Publication Title
Proceedings of SPIE - The International Society for Optical Engineering
Volume
7311
Number of Pages
-
Document Type
Article; Proceedings Paper
Personal Identifier
scopus
DOI Link
https://doi.org/10.1117/12.818726
Copyright Status
Unknown
Socpus ID
69649097612 (Scopus)
Source API URL
https://api.elsevier.com/content/abstract/scopus_id/69649097612
STARS Citation
Muravjov, A. V.; Veksler, D. B.; Hu, X.; Gaska, R.; and Pala, N., "Resonant Terahertz Absorption By Plasmons In Grating-Gate Gan Hemt Structures" (2009). Scopus Export 2000s. 12115.
https://stars.library.ucf.edu/scopus2000/12115