Title

Scanning Photoemission Microscope (Spem) To Study The Interface Chemistry Of Alti/C System

Abstract

After the Ti-rich carbide layer achieves a particular size, followed by a formation of another Ti-deficient mixed carbide interface, it fractures from the graphite substrate due to residual stresses introduced by volume changes upon carbide formation by reprecipitation process. As a result, infiltration of the liquid Al takes place and reacts with the graphite to form Al4C3. This interpretation is consistent with the scanning photoemission microscopic images as well as XPS data.

Publication Date

1-1-2000

Publication Title

Journal of Materials Science Letters

Volume

19

Issue

2

Number of Pages

123-126

Document Type

Article

Personal Identifier

scopus

DOI Link

https://doi.org/10.1023/A:1006647430214

Socpus ID

0033894471 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/0033894471

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