Scanning Photoemission Microscope (Spem) To Study The Interface Chemistry Of Alti/C System
After the Ti-rich carbide layer achieves a particular size, followed by a formation of another Ti-deficient mixed carbide interface, it fractures from the graphite substrate due to residual stresses introduced by volume changes upon carbide formation by reprecipitation process. As a result, infiltration of the liquid Al takes place and reacts with the graphite to form Al4C3. This interpretation is consistent with the scanning photoemission microscopic images as well as XPS data.
Journal of Materials Science Letters
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Seal, S.; Warwick, T.; and Sobczak, N., "Scanning Photoemission Microscope (Spem) To Study The Interface Chemistry Of Alti/C System" (2000). Scopus Export 2000s. 1215.