Title
Measuring Nonlinear Refraction And Its Dispersion
Abstract
We describe methods for measuring the nonlinear refraction of nominally transparent materials that involve propagation from the near to the far field, which changes a phase distortion into an amplitude redistribution. These methods include beam distortion methods and Z-scan. We also look at methods to determine the spectral dependence of these changes in refractive index. Recent advances here include using femtosecond white-light continua as the source for Z-scan. The types of nonlinear refractive mechanisms are also briefly discussed including bound-electronic, excited state or free-carrier generation, reorientation, electrostrictive, and thermal nonlinear refraction as well as cascaded second-order nonlinearities. © 2009 Springer New York.
Publication Date
1-2-2009
Publication Title
Topics in Applied Physics
Volume
114
Number of Pages
573-591
Document Type
Article; Proceedings Paper
Personal Identifier
scopus
DOI Link
https://doi.org/10.1007/978-0-387-34727-1_24
Copyright Status
Unknown
Socpus ID
58049169538 (Scopus)
Source API URL
https://api.elsevier.com/content/abstract/scopus_id/58049169538
STARS Citation
Van Stryland, Eric W. and Hagan, David J., "Measuring Nonlinear Refraction And Its Dispersion" (2009). Scopus Export 2000s. 12540.
https://stars.library.ucf.edu/scopus2000/12540