Title

Measuring Nonlinear Refraction And Its Dispersion

Abstract

We describe methods for measuring the nonlinear refraction of nominally transparent materials that involve propagation from the near to the far field, which changes a phase distortion into an amplitude redistribution. These methods include beam distortion methods and Z-scan. We also look at methods to determine the spectral dependence of these changes in refractive index. Recent advances here include using femtosecond white-light continua as the source for Z-scan. The types of nonlinear refractive mechanisms are also briefly discussed including bound-electronic, excited state or free-carrier generation, reorientation, electrostrictive, and thermal nonlinear refraction as well as cascaded second-order nonlinearities. © 2009 Springer New York.

Publication Date

1-2-2009

Publication Title

Topics in Applied Physics

Volume

114

Number of Pages

573-591

Document Type

Article; Proceedings Paper

Personal Identifier

scopus

DOI Link

https://doi.org/10.1007/978-0-387-34727-1_24

Socpus ID

58049169538 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/58049169538

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