Title
Reliability And Failure Mechanisms Of Lateral Mosfets In Synchronous Dc-Dc Buck Converter
Abstract
This paper present an evaluation of the reliability of LDMOS transistors in synchronous DC-DC buck converter using physical-based mixed device and circuit simulation. It is observed that impact ionization, lower temperature, and radiation degrade power MOSFET performances and could lead to potential failure if heavy ions strike the converter at critical time during switching. © 2009 IEEE.
Publication Date
1-1-2009
Publication Title
Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA
Number of Pages
671-677
Document Type
Article; Proceedings Paper
Personal Identifier
scopus
DOI Link
https://doi.org/10.1109/IPFA.2009.5232551
Copyright Status
Unknown
Socpus ID
71049189667 (Scopus)
Source API URL
https://api.elsevier.com/content/abstract/scopus_id/71049189667
STARS Citation
Yang, Boyi; Yuan, J. S.; and Shen, Z., "Reliability And Failure Mechanisms Of Lateral Mosfets In Synchronous Dc-Dc Buck Converter" (2009). Scopus Export 2000s. 12710.
https://stars.library.ucf.edu/scopus2000/12710