Title

Refractive Index Measurements Of Planar Chalcogenide Thin Film

Abstract

We report on the measurements of the refractive index of As-S-Se chalcogenide glasses near 1.55 μm. The measurements were made on annealed and non-annealed samples of thermally evaporated thin films. The data for two different series of glasses are presented: the compositions As 40S60-xSex and the compositions As xS(100-x)/2Se(100-x)/2 where the ratio of sulfur to selenium is kept constant (1:1). It has been found that replacing sulfur by selenium in the first series increases the refractive index from 2.4 to 2.8 and increasing the arsenic content in the second series increases the refractive index. In all cases, it has been found that annealing the samples increase the refractive index. The accuracy in the refractive index measurement is ±0.2%. © 2003 Elsevier B.V. All rights reserved.

Publication Date

10-15-2003

Publication Title

Journal of Non-Crystalline Solids

Volume

328

Issue

1-3

Number of Pages

183-191

Document Type

Article

Personal Identifier

scopus

DOI Link

https://doi.org/10.1016/S0022-3093(03)00527-1

Socpus ID

0141732316 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/0141732316

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