Title
The Characterization Of Saw Coupling Factor From Paired Idt Insertion Loss Measurements
Abstract
The extent to which the measured transmission insertion loss between paired identical unapodized IDTs can be correlated to the coupling factor of a piezoelectric substrate or piezo-film layer is considered in this paper. The paired transducer insertion loss of standard and rotated cuts of commonly used piezoelectric substrates with coupling factors in the range from 0.0001 to 0.1 were measured using a harmonic rich split finger IDT. The network analyzer measurements were made in a test fixture having a 50-ohm connection in close proximity to the transducer electrodes. The reported coupling factors were compared with the measured insertion loss values for fundamental and harmonic modes over a frequency range from 30 MHz to above 1.0 GHz. On the average a 20-dB increase in insertion loss represented a factor of 10 decrease in coupling factor. Graphical data was developed and applied to estimate the coupling factor values for AlN film layers on silicon substrates under various deposition conditions.
Publication Date
12-1-2002
Publication Title
Proceedings of the IEEE Ultrasonics Symposium
Volume
1
Number of Pages
231-234
Document Type
Article; Proceedings Paper
Personal Identifier
scopus
Copyright Status
Unknown
Socpus ID
0036992334 (Scopus)
Source API URL
https://api.elsevier.com/content/abstract/scopus_id/0036992334
STARS Citation
Hickernell, Fred S., "The Characterization Of Saw Coupling Factor From Paired Idt Insertion Loss Measurements" (2002). Scopus Export 2000s. 2345.
https://stars.library.ucf.edu/scopus2000/2345