Title
Resonant Enhancement Of Emission And Absorption Using Frequency Selective Surfaces In The Infrared
Keywords
Absorption; Frequency selective surfaces; Infrared
Abstract
We investigate the infrared properties of frequency selective surfaces consisting of aluminum patches on silicon substrates. Resonant behavior is found not only in the transmission and reflection, but also in the absorption and emission of these surfaces. The resonance location is a controllable function of the surface pattern. Simple model calculations reproduce well the qualitative behavior of our samples. © 2002 Elsevier Science B.V. All rights reserved.
Publication Date
4-1-2002
Publication Title
Infrared Physics and Technology
Volume
43
Issue
2
Number of Pages
101-107
Document Type
Article
Personal Identifier
scopus
DOI Link
https://doi.org/10.1016/S1350-4495(01)00134-7
Copyright Status
Unknown
Socpus ID
0036532783 (Scopus)
Source API URL
https://api.elsevier.com/content/abstract/scopus_id/0036532783
STARS Citation
Puscasu, Irina; Schaich, William; and Boreman, Glenn D., "Resonant Enhancement Of Emission And Absorption Using Frequency Selective Surfaces In The Infrared" (2002). Scopus Export 2000s. 2602.
https://stars.library.ucf.edu/scopus2000/2602