Title

Characterization Of Si In A W Matrix Using Diffraction Contrast In The Tem

Publication Date

1-1-2002

Publication Title

Microscopy and Microanalysis

Volume

8

Issue

SUPPL. 2

Number of Pages

790-791

Document Type

Article; Proceedings Paper

Personal Identifier

scopus

DOI Link

https://doi.org/10.1017/s1431927602105629

Socpus ID

0036415338 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/0036415338

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