Title
Electrical Properties Of Zno Thin Films Deposited By Pulsed Laser Deposition
Abstract
Structural and electronic transport properties of polycrystalline ZnO thin films, prepared by pulsed laser deposition, have been investigated. The films were deposited on glass and Si3N4/Si substrates using O2 and N2 atmospheres. X-ray analysis revealed preferential c-axis orientation perpendicular to the sample substrate. Films deposited under relatively high O2 pressure were highly resistive. However, the conductivity σ increased while the films were irradiated with ultraviolet light, showing an Arrhenius (In σ ∝ T-1) dependence as a function of temperature. The ZnO film deposited in N2 atmosphere exhibited at room temperature a resistivity - 1 Ω cm, and a sheet carrier concentration - 5 1012 cm-2. The variation of the conductivity with temperature, in the range 60-150 K, follows a In σ ∝ T-1/4 dependence characteristic of variable range hopping. An analysis of the experimental results of conductivity as a function of temperature, in terms of possible doping effects, as well as conduction mechanisms is presented. © 2005 Materials Research Society.
Publication Date
6-22-2005
Publication Title
Materials Research Society Symposium Proceedings
Volume
829
Number of Pages
151-156
Document Type
Article; Proceedings Paper
Personal Identifier
scopus
Copyright Status
Unknown
Socpus ID
20444429348 (Scopus)
Source API URL
https://api.elsevier.com/content/abstract/scopus_id/20444429348
STARS Citation
Heluani, S. P.; Simonelli, G.; and Villafuerte, M., "Electrical Properties Of Zno Thin Films Deposited By Pulsed Laser Deposition" (2005). Scopus Export 2000s. 3911.
https://stars.library.ucf.edu/scopus2000/3911