Title
Time-Resolved X-Ray Diffraction Study Of Ultrafast Acoustic Phonon Dynamics In Ge/Si-Heterostructures
Abstract
Using time-resolved x-ray diffraction the ultafast strain dynamics in fs-laserexcited Ge/Si-heterostructures has been studied. A fluence dependent, anharmonic damping of the impulsively generated acoustic phonons and vibrational transport across the buried Ge/Si-interface are observed. © Springer-Verlag Berlin Heidelberg 2001.
Publication Date
1-1-2001
Publication Title
Springer Series in Chemical Physics
Volume
66
Number of Pages
281-283
Document Type
Article
Personal Identifier
scopus
DOI Link
https://doi.org/10.1007/978-3-642-56546-5_81
Copyright Status
Unknown
Socpus ID
0035775856 (Scopus)
Source API URL
https://api.elsevier.com/content/abstract/scopus_id/0035775856
STARS Citation
Sokolowski-Tinten, K.; Cavalleri, A.; and Siders, C. W., "Time-Resolved X-Ray Diffraction Study Of Ultrafast Acoustic Phonon Dynamics In Ge/Si-Heterostructures" (2001). Scopus Export 2000s. 429.
https://stars.library.ucf.edu/scopus2000/429