Title

Nonlinear Spectrometer Using A White-Light Continuum Z Scan

Abstract

The single-wavelength Z scan technique for measuring the spectral dependencies of optical nonlinearities of materials is described. The method provides information about the frequency-degenerate nonlinear absorption (NLA) and nonlinear refraction (NLR). In this method, the transmittance of a beam, usually of Gaussian spatial profile, focused through a sample is measured as a function of the sample position Z with respect to the beam waist. The transmission measured through an aperture placed in the beam in front of the detector provides the sign and the magnitude of the NLR, once the NLA has been obtained.

Publication Date

1-1-2005

Publication Title

Optics and Photonics News

Volume

16

Issue

12 SPEC. ISS.

Number of Pages

28-

Document Type

Article

Personal Identifier

scopus

DOI Link

https://doi.org/10.1364/OPN.16.12.000028

Socpus ID

30644460146 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/30644460146

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