Title

Focused-Ion-Beam Assisted Fabrication Of Individual Multiwall Carbon Nanotube Field Emitter

Keywords

Carbon nanotubes; Field emission; Focused-ion-beam

Abstract

We report the fabrication of an individual carbon nanotube (CNT) electron field emitter using a focused-ion-beam (FIB) technique. The monolithic multiwall CNT with a graphitic shield is synthesized using chemical vapor deposition technique. The FIB technique is applied to attach the monolithic multiwall CNT on an etched tungsten tip. Field emission measurements are carried out in a vacuum of 10-7 Torr. Threshold voltage as low as 120 V has been obtained. © 2005 Elsevier Ltd. All rights reserved.

Publication Date

1-1-2005

Publication Title

Carbon

Volume

43

Issue

10

Number of Pages

2083-2087

Document Type

Article

Personal Identifier

scopus

DOI Link

https://doi.org/10.1016/j.carbon.2005.03.009

Socpus ID

22344440022 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/22344440022

This document is currently not available here.

Share

COinS