Title

Remote Sensing Through Reduced Mueller Matrix Elements

Keywords

Remote Sensing; Shape Determination

Abstract

Measurements of a reduced Mueller matrix in backscattering from diffusive, dielectric targets are reported as a function of the angle of incidence. It was found that the off-diagonal elements depend greatly on the angle of incidence, increasing to a maximum near grazing incidence. A theoretical model that accounts for the non-trivial behavior in the off-diagonal elements of the Mueller matrix is presented. We comment on the applicability of this model to the determination of the shape of the targets.

Publication Date

1-1-2001

Publication Title

Proceedings of SPIE - The International Society for Optical Engineering

Volume

4380

Number of Pages

509-520

Document Type

Article; Proceedings Paper

Personal Identifier

scopus

DOI Link

https://doi.org/10.1117/12.436979

Socpus ID

0035166342 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/0035166342

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