Title
Measurement Of Photo-Induced Refractive Index Change In As 0.42-X-YGeXSbYS0.58 Bulks Induced By Fs Near Ir Laser Exposure
Abstract
Fs NIR exposure has been used to induce refractive index change in bulks in the As0.42-x-yGexSbyS0.58 system. Photoinduced Δn has been investigated as a function of laser dose by measuring diffraction efficiency of buried gratings. ©2007 IEEE.
Publication Date
12-1-2007
Publication Title
Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS
Number of Pages
100-101
Document Type
Article; Proceedings Paper
Personal Identifier
scopus
DOI Link
https://doi.org/10.1109/LEOS.2007.4382295
Copyright Status
Unknown
Socpus ID
51249086042 (Scopus)
Source API URL
https://api.elsevier.com/content/abstract/scopus_id/51249086042
STARS Citation
Choi, J.; Carlie, N.; Petit, L.; Anderson, T.; and Richardson, K., "Measurement Of Photo-Induced Refractive Index Change In As 0.42-X-YGeXSbYS0.58 Bulks Induced By Fs Near Ir Laser Exposure" (2007). Scopus Export 2000s. 6102.
https://stars.library.ucf.edu/scopus2000/6102