Title

Accurate Determination Of The Optical Performances Of Antireflective Coatings By Low Coherence Reflectometry

Abstract

We propose to use optical low coherence reflectometry to measure the reflectance of both faces of a plane substrate with one side coated in antireflective layers. We identify, through a detailed theoretical analysis, the optimum configuration and evaluate the expected sensitivity and accuracy of some realistic examples. Finally, we experimentally demonstrate the ability of this method to quantify reflection coefficients as low as 5 × 10- 7. That way, an accurate characterization of the performances, at 1550 nm, of antireflective coatings deposited on various plane substrates is achieved. © 2007 Optical Society of America.

Publication Date

8-10-2007

Publication Title

Applied Optics

Volume

46

Issue

23

Number of Pages

5635-5644

Document Type

Article

Personal Identifier

scopus

DOI Link

https://doi.org/10.1364/AO.46.005635

Socpus ID

35948986339 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/35948986339

This document is currently not available here.

Share

COinS