Title
Rigorous Electromagnetic Analysis Of Volumetrically Complex Media Using The Slice Absorption Method
Abstract
There is tremendous demand for numerical methods to perform rigorous analysis of devices that are both large scale and complex throughout their volume. This can arise when devices must be considered with realistic geometry or when they contain artificial materials such as photonic crystals, left-handed materials, nanoparticles, or other metamaterials. The slice absorption method (SAM) was developed to address this need. The method is fully numerical and able to break large problems down into small pieces, or slices, using matrix division or Gaussian elimination instead of eigensystem computations and scattering matrix manipulations. In these regards, the SAM is an attractive alternative to popular techniques like the finite-difference time domain method, rigorous coupled-wave analysis, and the transfer matrix method. To demonstrate the utility of the SAM and benchmark its accuracy, reflection was simulated for a photonic crystal fabricated in SU-8 by multiphoton direct laser writing. Realistic geometry was incorporated into the model by simulating the microfabrication process, which yielded simulation results that matched experimental measurements remarkably well. © 2007 Optical Society of America.
Publication Date
1-1-2007
Publication Title
Journal of the Optical Society of America A: Optics and Image Science, and Vision
Volume
24
Issue
10
Number of Pages
3123-3134
Document Type
Article
Personal Identifier
scopus
DOI Link
https://doi.org/10.1364/JOSAA.24.003123
Copyright Status
Unknown
Socpus ID
36949036458 (Scopus)
Source API URL
https://api.elsevier.com/content/abstract/scopus_id/36949036458
STARS Citation
Rumpf, Raymond C.; Tal, Amir; and Kuebler, Stephen M., "Rigorous Electromagnetic Analysis Of Volumetrically Complex Media Using The Slice Absorption Method" (2007). Scopus Export 2000s. 7049.
https://stars.library.ucf.edu/scopus2000/7049