Title
Systems Engineering Analysis Of Image Quality
Abstract
A linear systems approach (multiplying MTFs or convolving PSFs) to performing a complete systems engineering analysis of image quality is described. This includes not only the traditional diffraction analysis and the evaluation of image degradation from residual design errors; but also includes image degradation due to scattering effects from residual optical fabrication errors, assembly and alignment errors, and all other potential error sources appearing in a detailed error budget tree. The effects of mosaic detector arrays upon systems performance and the optimum system design will also be discussed. This analysis allows optical fabrication tolerances to be determined during the design phase of a program, frequently resulting in substantial cost and schedule savings. Inaccuracies in the linear systems assumption will be presented for several different applications.
Publication Date
12-1-2000
Publication Title
Proceedings of SPIE - The International Society for Optical Engineering
Volume
4093
Number of Pages
379-388
Document Type
Article; Proceedings Paper
Personal Identifier
scopus
DOI Link
https://doi.org/10.1117/12.405229
Copyright Status
Unknown
Socpus ID
0034538625 (Scopus)
Source API URL
https://api.elsevier.com/content/abstract/scopus_id/0034538625
STARS Citation
Harvey, James E. and Krywonas, A., "Systems Engineering Analysis Of Image Quality" (2000). Scopus Export 2000s. 705.
https://stars.library.ucf.edu/scopus2000/705