Title
Nonlinear Refraction Of Semiconductor Quantum Dots Using Single Wavelength And White-Light Continuum Z-Scan
Abstract
The nonlinear refractive index is measured in semiconductor quantum-dots using white light continuum Z-scan, which can measure nonlinear refraction as small as 10-16cm2/GW. The magnitude of the nonlinearity decreases for smaller quantum-dots. © 2007 Optical Society of America.
Publication Date
1-1-2007
Publication Title
Optics InfoBase Conference Papers
Number of Pages
-
Document Type
Article; Proceedings Paper
Personal Identifier
scopus
DOI Link
https://doi.org/10.1364/nlo.2007.mc5
Copyright Status
Unknown
Socpus ID
85088718859 (Scopus)
Source API URL
https://api.elsevier.com/content/abstract/scopus_id/85088718859
STARS Citation
Padilha, Lazaro A.; Nootz, Gero; Balu, Mihaela; Hagan, David J.; and Van Stryland, Eric W., "Nonlinear Refraction Of Semiconductor Quantum Dots Using Single Wavelength And White-Light Continuum Z-Scan" (2007). Scopus Export 2000s. 7087.
https://stars.library.ucf.edu/scopus2000/7087