Title
Robust Esd Protection Solutions In Cmos/Bicmos Technologies
Keywords
Electrostatic discharge; Holding voltage; Latchup; Silicon controlled rectifier; Voltage snapback
Abstract
Robust and novel devices called High Holding, Low-Voltage-Trigger Silicon Controlled Rectifiers (HH-LVTSCRs) for Electrostatic Discharge (ESD) protection of integrated circuits (ICs) are designed, fabricated and characterized. The S-type current-voltage (I-V) characteristics of the HH-LVTSCRs are adjustable to different operating conditions by changing the device dimensions and terminal interconnections. Experimental results demonstrate that HH-LVTSCRs with a multiple-finger layout render high levels of ESD protection per unit area, applicable in the design of ICs with stringent ESD protection requirements of over 15 kV IEC. ©2007 IEEE.
Publication Date
1-1-2007
Publication Title
Proceeding of 2007 International Workshop on Electron Devices and Semiconductor Technology, IEDST 2007
Number of Pages
41-45
Document Type
Article; Proceedings Paper
Personal Identifier
scopus
DOI Link
https://doi.org/10.1109/edst.2007.4289774
Copyright Status
Unknown
Socpus ID
36849063270 (Scopus)
Source API URL
https://api.elsevier.com/content/abstract/scopus_id/36849063270
STARS Citation
Liou, Juin J.; Salcedo, Javier A.; and Liu, Zhiwei, "Robust Esd Protection Solutions In Cmos/Bicmos Technologies" (2007). Scopus Export 2000s. 7263.
https://stars.library.ucf.edu/scopus2000/7263