Title

Generalization Of The Rouard Method To An Absorbing Thin-Film Stack And Application To Surface Plasmon Resonance

Abstract

In the context of surface plasmon resonance (SPR) kinetic biochips, it is important to model the SPR phenomenon (i.e., extinction of reflectivity) toward biochip design and optimization. The Rouard approach that models reflectivity off a thin-film stack is shown to be extendable to any number of absorbing layers with no added complexity. Using the generalized Rouard method, the effect of SPR is simulated as a function of the wavelength for various metal thicknesses. Given an optimal metal thickness, the dependence of SPR on the angle of incidence and wavelength is also demonstrated. Such a model constitutes a potential basis for the efficient design and optimization of multidimensional sensors. © 2006 Optical Society of America.

Publication Date

11-20-2006

Publication Title

Applied Optics

Volume

45

Issue

33

Number of Pages

8419-8423

Document Type

Article

Personal Identifier

scopus

DOI Link

https://doi.org/10.1364/AO.45.008419

Socpus ID

33847028031 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/33847028031

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