Title

Reflective Infrared Ellipsometry Of Plastic Films

Keywords

Frequency selective surface; FTIR; Infrared ellipsometry; Optical constants; Plastics; Polymer

Abstract

High resolution reflective ellipsometry is used to study freely suspended plastic films. We determine room temperature optical constants in the infrared for a variety of plastics using ellipsometry. The films are typically 6 to 100 μm thick and measurements are performed from near infrared to long wave-IR. The setup includes modeling software to fit the ellipsometric data to a generalized oscillator model. The films studied include acrylics, fluoropolymers, and variations of polyethylene, polystyrene, and polyvinyl chloride (PVC) among others. We are able to determine in-plane and out-of-plane optical constants. Transmission spectra from FTIR measurements are plotted and compared with ellipsometry results. © Springer Science+Business Media, LLC 2006.

Publication Date

11-1-2006

Publication Title

International Journal of Infrared and Millimeter Waves

Volume

27

Issue

11

Number of Pages

1553-1571

Document Type

Article

Personal Identifier

scopus

DOI Link

https://doi.org/10.1007/s10762-006-9150-3

Socpus ID

34249723198 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/34249723198

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