Title

Localized Measurement Of The Optical Thickness Of A Transparent Window: Application To The Study Of The Photosensitivity Of Organic Polymers

Abstract

The development of an optical setup that permits us to carry out high-resolution mappings of the absolute optical thickness of plane-parallel transparent windows is described. This measurement is based on the recording and processing of the spectral transmission of the wafer between 1520 and 1570 nm and has a relative precision better than 10-6. Hence it is used for the characterization of the photosensitivity of two organic photopolymers (cationic ring opening polymer and poly(methylmethacrylate)). The refractive index change dynamics for both materials and the spontaneous evolution of the optical thickness are demonstrated. © 2006 Optical Society of America.

Publication Date

8-20-2006

Publication Title

Applied Optics

Volume

45

Issue

24

Number of Pages

6099-6105

Document Type

Article

Personal Identifier

scopus

DOI Link

https://doi.org/10.1364/AO.45.006099

Socpus ID

33749828565 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/33749828565

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