Title
Oxygen Diffusion Through Al-Doped Amorphous Sio 2
Keywords
Carbonitrides; Diffusivity measurements; Error function modeling; Experimental study; Mass spectrometry; Oxide systems; Tracer diffusivity
Abstract
Oxygen (O) diffusion through pure and aluminum (Al)-doped amorphous silica is investigated by using secondary ion mass spectrometry to profile the diffusion of an 18O tracer. The oxides are formed by the thermal oxidation of polymer-derived SiCN and SiAlCN ceramics. The authors demonstrate that a small amount of Al dopant can significantly inhibit both the interstitial and network diffusion of O. The activation energy of O network diffusion for Al-doped silica is two times higher than that for pure silica. The results are discussed in terms of the modification of Al doping on the network structure of the otherwise pure silica. © ASM International.
Publication Date
12-1-2006
Publication Title
Journal of Phase Equilibria and Diffusion
Volume
27
Issue
6
Number of Pages
671-675
Document Type
Article; Proceedings Paper
Personal Identifier
scopus
DOI Link
https://doi.org/10.1361/154770306X153729
Copyright Status
Unknown
Socpus ID
33845796536 (Scopus)
Source API URL
https://api.elsevier.com/content/abstract/scopus_id/33845796536
STARS Citation
Wang, Ylguang; Sohn, Yongho; Fan, Yi; Zhang, Ligong; and An, Linan, "Oxygen Diffusion Through Al-Doped Amorphous Sio 2" (2006). Scopus Export 2000s. 8118.
https://stars.library.ucf.edu/scopus2000/8118