Title
Investigation Of Diode Geometry And Metal Line Pattern For Robust Esd Protection Applications
Abstract
The effect of different diode geometries and metal patterns on the failure current It2 is investigated experimentally. The devices considered are N+/P well LOCOS diodes having different lengths, widths, finger numbers, and metal connections. The results provide useful insights into optimizing the diode for robust electrostatic discharge (ESD) protection applications. © 2008 Elsevier Ltd. All rights reserved.
Publication Date
10-1-2008
Publication Title
Microelectronics Reliability
Volume
48
Issue
10
Number of Pages
1660-1663
Document Type
Article
Personal Identifier
scopus
DOI Link
https://doi.org/10.1016/j.microrel.2008.04.019
Copyright Status
Unknown
Socpus ID
50949104760 (Scopus)
Source API URL
https://api.elsevier.com/content/abstract/scopus_id/50949104760
STARS Citation
Li, You; Liou, Juin J.; and Vinson, Jim, "Investigation Of Diode Geometry And Metal Line Pattern For Robust Esd Protection Applications" (2008). Scopus Export 2000s. 9375.
https://stars.library.ucf.edu/scopus2000/9375