Title
Editorial
Publication Date
5-1-2010
Publication Title
Microelectronics Reliability
Volume
50
Issue
5
Number of Pages
583-
Document Type
Editorial Material
Personal Identifier
scopus
DOI Link
https://doi.org/10.1016/j.microrel.2010.02.010
Copyright Status
Unknown
Socpus ID
77953209626 (Scopus)
Source API URL
https://api.elsevier.com/content/abstract/scopus_id/77953209626
STARS Citation
Liou, Juin J. and Lai, Chao Sung, "Editorial" (2010). Scopus Export 2010-2014. 1165.
https://stars.library.ucf.edu/scopus2010/1165
COinS